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SSM3K16CTC Datasheet(PDF) 3 Page - Toshiba Semiconductor

Part # SSM3K16CTC
Description  MOSFETs Silicon N-Channel MOS
PDF  8 Pages
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

SSM3K16CTC Datasheet(HTML) 3 Page - Toshiba Semiconductor

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SSM3K16CTC
3
5.
5.
5.
5. Electrical Characteristics
Electrical Characteristics
Electrical Characteristics
Electrical Characteristics
5.1.
5.1.
5.1.
5.1. Static Characteristics (Unless otherwise specified, T
Static Characteristics (Unless otherwise specified, T
Static Characteristics (Unless otherwise specified, T
Static Characteristics (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25 
))))
Characteristics
Gate leakage current
Drain cut-off current
Drain-source breakdown voltage
Drain-source breakdown voltage
Gate threshold voltage
Drain-source on-resistance
Forward transfer admittance
(Note 1)
(Note 2)
(Note 3)
(Note 3)
Symbol
IGSS
IDSS
V(BR)DSS
V(BR)DSX
Vth
RDS(ON)
|Yfs|
Test Condition
VGS = ±10 V, VDS = 0 V
VDS = 20 V, VGS = 0 V
ID = 1 mA, VGS = 0 V
ID = 1 mA, VGS = -10 V
VDS = 3 V, ID = 1 mA
ID = 100 mA, VGS = 4.5 V
ID = 50 mA, VGS = 2.5 V
ID = 20 mA, VGS = 1.8 V
ID = 10 mA, VGS = 1.5 V
VDS = 3 V, ID = 100 mA
Min
20
12
0.35
0.14
Typ.
1.6
2.1
2.6
3.0
0.28
Max
±1
1
1.0
2.2
3.0
4.0
5.6
Unit
µA
µA
V
V
V
S
Note 1: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drain-
source breakdown voltage is lowered in this mode.
Note 2: Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (1 mA for
this device). Then, for normal switching operation, VGS(ON) must be higher than Vth, and VGS(OFF) must be
lower than Vth. This relationship can be expressed as: VGS(OFF) < Vth < VGS(ON).
Take this into consideration when using the device.
Note 3: Pulse measurement.
5.2.
5.2.
5.2.
5.2. Dynamic Characteristics (Unless otherwise specified, T
Dynamic Characteristics (Unless otherwise specified, T
Dynamic Characteristics (Unless otherwise specified, T
Dynamic Characteristics (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25 
))))
Characteristics
Input capacitance
Reverse transfer capacitance
Output capacitance
Switching time (turn-on time)
Switching time (turn-off time)
Symbol
Ciss
Crss
Coss
ton
toff
Test Condition
VDS = 10 V, VGS = 0 V,
f = 1 MHz
VDD = 10 V, ID = 100 mA
VGS = 0 to 2.5 V, RG = 50 Ω
Duty ≤ 1 %,VIN: tr, tf < 5 ns,
Common source, See Chapter 5.3.
Min
Typ.
12
4.1
5.5
18
36
Max
Unit
pF
ns
5.3.
5.3.
5.3.
5.3. Switching Time Test Circuit
Switching Time Test Circuit
Switching Time Test Circuit
Switching Time Test Circuit
Fig.
Fig.
Fig.
Fig. 5.3.1
5.3.1
5.3.1
5.3.1 Switching Time Test Circuit
Switching Time Test Circuit
Switching Time Test Circuit
Switching Time Test Circuit
Fig.
Fig.
Fig.
Fig. 5.3.2
5.3.2
5.3.2
5.3.2 Input Waveform/Output Waveform
Input Waveform/Output Waveform
Input Waveform/Output Waveform
Input Waveform/Output Waveform
5.4.
5.4.
5.4.
5.4. Source-Drain Characteristics (Unless otherwise specified, T
Source-Drain Characteristics (Unless otherwise specified, T
Source-Drain Characteristics (Unless otherwise specified, T
Source-Drain Characteristics (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25 
))))
Characteristics
Diode forward voltage
(Note 1)
Symbol
VDSF
Test Condition
ID = -200 mA, VGS = 0 V
Min
Typ.
-0.89
Max
-1.2
Unit
V
Note 1: Pulse measurement.
2017-11-30
Rev.2.0
©2016-2017
Toshiba Electronic Devices & Storage Corporation



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