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SSM3K16CTC Datasheet(PDF) 3 Page - Toshiba Semiconductor |
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SSM3K16CTC Datasheet(HTML) 3 Page - Toshiba Semiconductor |
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3 / 8 page ![]() SSM3K16CTC 3 5. 5. 5. 5. Electrical Characteristics Electrical Characteristics Electrical Characteristics Electrical Characteristics 5.1. 5.1. 5.1. 5.1. Static Characteristics (Unless otherwise specified, T Static Characteristics (Unless otherwise specified, T Static Characteristics (Unless otherwise specified, T Static Characteristics (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Gate leakage current Drain cut-off current Drain-source breakdown voltage Drain-source breakdown voltage Gate threshold voltage Drain-source on-resistance Forward transfer admittance (Note 1) (Note 2) (Note 3) (Note 3) Symbol IGSS IDSS V(BR)DSS V(BR)DSX Vth RDS(ON) |Yfs| Test Condition VGS = ±10 V, VDS = 0 V VDS = 20 V, VGS = 0 V ID = 1 mA, VGS = 0 V ID = 1 mA, VGS = -10 V VDS = 3 V, ID = 1 mA ID = 100 mA, VGS = 4.5 V ID = 50 mA, VGS = 2.5 V ID = 20 mA, VGS = 1.8 V ID = 10 mA, VGS = 1.5 V VDS = 3 V, ID = 100 mA Min 20 12 0.35 0.14 Typ. 1.6 2.1 2.6 3.0 0.28 Max ±1 1 1.0 2.2 3.0 4.0 5.6 Unit µA µA V V V Ω S Note 1: If a reverse bias is applied between gate and source, this device enters V(BR)DSX mode. Note that the drain- source breakdown voltage is lowered in this mode. Note 2: Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (1 mA for this device). Then, for normal switching operation, VGS(ON) must be higher than Vth, and VGS(OFF) must be lower than Vth. This relationship can be expressed as: VGS(OFF) < Vth < VGS(ON). Take this into consideration when using the device. Note 3: Pulse measurement. 5.2. 5.2. 5.2. 5.2. Dynamic Characteristics (Unless otherwise specified, T Dynamic Characteristics (Unless otherwise specified, T Dynamic Characteristics (Unless otherwise specified, T Dynamic Characteristics (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Input capacitance Reverse transfer capacitance Output capacitance Switching time (turn-on time) Switching time (turn-off time) Symbol Ciss Crss Coss ton toff Test Condition VDS = 10 V, VGS = 0 V, f = 1 MHz VDD = 10 V, ID = 100 mA VGS = 0 to 2.5 V, RG = 50 Ω Duty ≤ 1 %,VIN: tr, tf < 5 ns, Common source, See Chapter 5.3. Min Typ. 12 4.1 5.5 18 36 Max Unit pF ns 5.3. 5.3. 5.3. 5.3. Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Fig. Fig. Fig. Fig. 5.3.1 5.3.1 5.3.1 5.3.1 Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Switching Time Test Circuit Fig. Fig. Fig. Fig. 5.3.2 5.3.2 5.3.2 5.3.2 Input Waveform/Output Waveform Input Waveform/Output Waveform Input Waveform/Output Waveform Input Waveform/Output Waveform 5.4. 5.4. 5.4. 5.4. Source-Drain Characteristics (Unless otherwise specified, T Source-Drain Characteristics (Unless otherwise specified, T Source-Drain Characteristics (Unless otherwise specified, T Source-Drain Characteristics (Unless otherwise specified, Taaaa = 25 = 25 = 25 = 25 )))) Characteristics Diode forward voltage (Note 1) Symbol VDSF Test Condition ID = -200 mA, VGS = 0 V Min Typ. -0.89 Max -1.2 Unit V Note 1: Pulse measurement. 2017-11-30 Rev.2.0 ©2016-2017 Toshiba Electronic Devices & Storage Corporation |
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