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AM29SL800B Datasheet(PDF) 27 Page - Advanced Micro Devices |
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AM29SL800B Datasheet(HTML) 27 Page - Advanced Micro Devices |
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27 / 41 page  Am29SL800B 27 ADV ANCE I N FO RMAT I O N AC CHARACTERISTICS Read Operations Notes: 1. Not 100% tested. 2. See Figure 11 and Table 7 for test specifications. Parameter Description Speed Option JEDEC Std Test Setup 170 200 Unit tAVAV tRC Read Cycle Time (Note 1) Min 170 200 ns tAVQV tACC Address to Output Delay CE# = VIL OE# = VIL Max 170 200 ns tELQV tCE Chip Enable to Output Delay OE# = VIL Max 170 200 ns tGLQV tOE Output Enable to Output Delay Max 90 90 ns tEHQZ tDF Chip Enable to Output High Z (Note 1) Max 50 60 ns tGHQZ tDF Output Enable to Output High Z (Note 1) Max 50 60 ns tOEH Output Enable Hold Time (Note 1) Read Min 0 ns Toggle and Data# Polling Min 30 ns tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First (Note 1) Min 0 ns tCE Outputs WE# Addresses CE# OE# HIGH Z Output Valid HIGH Z Addresses Stable tRC tACC tOEH tOE 0 V RY/BY# RESET# tDF tOH 21545A-17 Figure 13. Read Operations Timings |
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