EHP-A09 datasheet(8/10 Pages) EVERLIGHT

8 / 10 page

EVERLIGHT ELECTRONICS CO.,LTD.

EHP-A09/SUR31-PU5/TR

Everlight Electronics Co., Ltd.

http://www.everlight.com

Rev. 1.0

Page: 8/10

Device No. : DSE-A09-002

Prepared date: Nov. 27, 2007

Prepared by: Terry Hsu

Reliability Test Items

Stress Test

Stress Condition

Stress Duration

Reflow

Tsol=260°C, 10sec, 6min(total)

2 times

DC Operating Life

Ta=25°C , IF=150mA

1000 hours

High Temperature Storage

Ta=100°C

1000 hours

High Temperature Operation Life #1

Ta=55°C, IF=150mA

1000 hours

High Temperature Operation Life #2

Ta=85

, IF=120mA

1000hours

Low Temperature Storage

Ta=-40°C

1000 hours

High Temperature/

Humidity Reverse Bias

Ta=85

, RH=85%

1000hours

High Temperature/

Humidity Operation Life

Ta=85°C , RH=60%, IF=120mA

1000 hours

Temperature Cycle

100°C

15min.

' 5min.

40°C

15min.

300 Cycles

Power Temperature Cycle

85°C

15min.

' 5min.

40°C

15min.

1000 Cycles

Thermal

Shock

110°C

5min.

' 10sec.

40°C

5min.

300 Cycles

Pulse Test

Ta=25

, IF=1000mA

30mS on/ 2500mS off

30000 times

ESD Human Body Model

2000V, Interval:0.5sec

3 times

ESD Machine Model

200V, Interval:0.5sec

3 times

*lm: Brightness attenuate difference(1000hrs)

50%

*VF: Forward voltage difference

20%

Notes: All reliability items are tested under superior thermal management with 1.5 x 1.5 cm

2 MCPCB.

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