US5C3257L-S16-R datasheet(4/6 Pages) UTC

4 / 6 page

US5C3257

Preliminary

CMOS IC

UNISONICTECHNOLOGIESCO.,LTD

4 of 6

www.unisonic.com.tw

QW-R502-891.a

ABSOLUTE MAXIMUM RATING

PARAMETER

SYMBOL

RATINGS

UNIT

Supply Voltage to Ground Potential (Inputs & VCC Only)

-0.5~+7.0

Supply Voltage to Ground Potential (Outputs & D/O Only)

-0.5~+7.0

DC Input Voltage

-0.5~+7.0

DC Output Current

120

Power Dissipation

0.5

Storage Temperature

TSTG

-55~+150

°C

Ambient Temperature with Power Applied

TOPR

-40~+85

°C

Note: Absolute maximum ratings are those values beyond which the device could be permanently damaged.

Absolute maximum ratings are stress ratings only and functional device operation is not implied.

DC ELECTRICAL CHARACTERISTICS

(Typical application at VCC=5 V, TA=25°C, unless otherwise noted)

PARAMETER

SYMBOL

TEST CONDITIONS (Note 1)

MIN

TYP

(Note 1)

MAX

UNIT

Input HIGH Voltage

VIH

Guaranteed Logic HIGH Level

2.0

Input LOW Voltage

VIL

Guaranteed Logic LOW Level

-0.5

0.8

Input HIGH Current

IIH

VCC=Max., VIN=VCC

±1

µA

Input LOW Current

IIL

VCC=Max., VIN=GND

±1

µA

High Impedance Output Current

IOZH

0≤I, Y≤VCC

±1

µA

Clamp Diode Voltage

VIK

VCC=Min., IIN=-18mA

-0.7

-1.2

Short Circuit Current (Note 2)

IOS

I(Y)=0V, Y(I)=VCC

100

Input Hysteresis at Control Pins

150

Switch On Resistance (Note 3)

RON

VCC=Min., VIN=0.0V, ION=48mA

Ω

VCC=Min., VIN=2.4V, ION=15mA

Ω

CAPACITANCE (TA=25°C, f=1MHz)

PARAMETER (Note 4)

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Input Capacitance

CIN

VIN=0V

In/Yn Capacitance, Switch Off

COFF

VIN=0V

In/Yn Capacitance, Switch On

CON

VIN=0V

Notes:1. Typical values are at VCC=5.0V, TA=25°C ambient and maximum loading.

2. Not more than one output should be shorted at one time. Duration of the test should not exceed one

second.

3. Measured by the voltage drop between I and Y pin at indicated current through the switch. ON resistance is

determined by the lower of the voltages on the two (I, Y) pins.

4. This parameter is determined by device characterization but is not production tested.

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