Electronic Components Datasheet Search
  Indian  ▼
ALLDATASHEET.IN

X  

SPC56EL54x Datasheet(PDF) 32 Page - STMicroelectronics

Part # SPC56EL54x
Description  Dual issue five-stage pipeline core
PDF  165 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

SPC56EL54x Datasheet(HTML) 32 Page - STMicroelectronics

Back Button SPC56EL54x Datasheet HTML 28Page - STMicroelectronics SPC56EL54x Datasheet HTML 29Page - STMicroelectronics SPC56EL54x Datasheet HTML 30Page - STMicroelectronics SPC56EL54x Datasheet HTML 31Page - STMicroelectronics SPC56EL54x Datasheet HTML 32Page - STMicroelectronics SPC56EL54x Datasheet HTML 33Page - STMicroelectronics SPC56EL54x Datasheet HTML 34Page - STMicroelectronics SPC56EL54x Datasheet HTML 35Page - STMicroelectronics SPC56EL54x Datasheet HTML 36Page - STMicroelectronics Next Button
Zoom Inzoom in Zoom Outzoom out
 32 / 165 page
background image
Introduction
SPC56ELx, SPC564Lx
32/165
DocID15457 Rev 12
exceptions, etc.), allowing the development tool to interpolate what transpires
between the discontinuities. Thus, static code may be traced.
Watchpoint messaging (WPM) via the auxiliary port
Watchpoint trigger enable of program and/or data trace messaging
Data tracing of instruction fetches via private opcodes
1.5.39
IEEE 1149.1 JTAG Controller (JTAGC)
The JTAGC block provides the means to test chip functionality and connectivity while
remaining transparent to system logic when not in test mode. All data input to and output
from the JTAGC block is communicated in serial format. The JTAGC block is compliant with
the IEEE standard.
The JTAG controller provides the following features:
IEEE Test Access Port (TAP) interface with 5 pins:
–TDI
–TMS
–TCK
–TDO
–JCOMP
Selectable modes of operation include JTAGC/debug or normal system operation
5-bit instruction register that supports the following IEEE 1149.1-2001 defined
instructions:
–BYPASS
IDCODE
–EXTEST
–SAMPLE
SAMPLE/PRELOAD
3 test data registers: a bypass register, a boundary scan register, and a device
identification register. The size of the boundary scan register is parameterized to
support a variety of boundary scan chain lengths.
TAP controller state machine that controls the operation of the data registers,
instruction register and associated circuitry



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com