High-Intensity LED in Plastic

T-1¾ Package

OVLGx0CyB9 Series

© TT electronics plc

Issue D 08/2017

Page 6

TT Electronics | Optek Technology, Inc.

1645 Wallace Drive, Ste. 130, Carrollton, TX USA 75006 |Ph: +1 972 323 2200

www.ttelectronics.com | sensors@ttelectronics.com

General Note

TT Electronics reserves the right to make changes in product specification without

notice or liability. All information is subject to TT Electronics’ own data and is

considered accurate at time of going to print.

Symbol

Test Conditions

Criteria for Judgment

Test Item

Min.

Max

Luminous Intensity

LSLx0.7 **

Forward Voltage

USLx1.1 *

( * ) USL: Upper Standard Level, ( ** ) LSL: Lower Standard Level

Reliability Test

LED lamps are checked by reliability tests based on MIL standards.

1. Test Conditions, Acceptable Criteria & Results

Classification

Test Item

Std. Test

Method

Test Conditions

Duration Unit

Acc / Rej

Criteria

Result

Life Test

Operation Life Test

(OLT)

MIL-STD-750D

Method 1026.3

1000 Hrs

100

0 / 1

Pass

High Temperature

Storage (HTS)

MIL-STD-750D

Method 1032.1

1000 Hrs

100

0 / 1

Pass

Low Temperature

Storage (LTS)

MIL-STD-750D

Method 1032.1

1000 Hrs

100

0 / 1

Pass

Temp. & Humidity

with Bias (THB)

MIL-STD-750D

Method 103B

500 Hrs

100

0 / 1

Pass

Thermal Shock Test

(TST)

MIL-STD-750D

Method 1056.1

0°C

~

100°C

2min

2min

100 cycles

100

0 / 1

Pass

Temperature Cy-

cling Test (TCT)

MIL-STD-750D

Method 1051.5

-40°C ~ 25°C ~ 100°C ~ 25°C

30min 5min 30min 5min

100 cycles

100

0 / 1

Pass

Solderability

MIL-STD-750D

Method 2026.4

235±5°C , 5 sec.

1 time

20

0 / 1

Pass

Resistance to Sol-

dering Heat

MIL-STD-750D

Method 2031.1

260±5°C , 5 sec.

1 time

20

0 / 1

Pass

Lead Integrity

MIL-STD-750D

Method 2036.3

Load 2.5N (0.25kgf)

0°~90°~0° , bend

3 times

20

0 / 1

Pass