STM32F103XC datasheet(40/118 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32F103xC, STM32F103xD, STM32F103xE

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5.3.4

Embedded reference voltage

The parameters given in Table 12 are derived from tests performed under ambient

temperature and VDD supply voltage conditions summarized in Table 9.

5.3.5

Supply current characteristics

The current consumption is measured as described in Figure 12: Current consumption

measurement scheme.

Maximum current consumption

The MCU is placed under the following conditions:

●

All I/O pins are in input mode with a static value at VDD or VSS (no load)

●

All peripherals are disabled except when explicitly mentioned

●

The Flash memory access time is adjusted to the fHCLK frequency (0 wait state from 0

to 24 MHz, 1 wait state from 24 to 48 MHz and 2 wait states above)

●

Prefetch in ON (reminder: this bit must be set before clock setting and bus prescaling)

●

When the peripherals are enabled fPCLK1 = fHCLK/2, fPCLK2 = fHCLK

The parameters given in Table 13, Table 14 and Table 15 are derived from tests performed

under ambient temperature and VDD supply voltage conditions summarized in Table 9.

Table 12.

Embedded internal reference voltage

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VREFINT

Internal reference voltage

−40 °C < TA < +105 °C

1.16

1.20

1.26

−40 °C < TA < +85 °C

1.16

1.20

1.24

TS_vrefint

(1)

Shortest sampling time can be determined in the application by multiple iterations.

ADC sampling time when

reading the internal reference

voltage

5.1

17.1

µs

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