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LQFP64 Datasheet(PDF) 65 Page - STMicroelectronics

Part # LQFP64
Description  Low-density access line, ARM-based 32-bit MCU with 16 or 32 KB Flash, 5 timers, ADC and 4 communication interfaces
PDF  79 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

LQFP64 Datasheet(HTML) 65 Page - STMicroelectronics

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STM32F101x4, STM32F101x6
Electrical characteristics
Doc ID 15058 Rev 5
65/79
Equation 1: RAIN max formula:
The formula above (Equation 1) is used to determine the maximum external impedance allowed for an
error below 1/4 of LSB. Here N = 12 (from 12-bit resolution).
Table 43.
RAIN max for fADC = 14 MHz
(1)
1.
Guaranteed by design, not tested in production.
Ts (cycles)
tS (µs)
RAIN max (kΩ)
1.5
0.11
0.4
7.5
0.54
5.9
13.5
0.96
11.4
28.5
2.04
25.2
41.5
2.96
37.2
55.5
3.96
50
71.5
5.11
NA
239.5
17.1
NA
Table 44.
ADC accuracy - limited test conditions(1) (2)
1.
ADC DC accuracy values are measured after internal calibration.
2.
ADC Accuracy vs. Negative Injection Current: Injecting negative current on any of the standard (non-
robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion
being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to
standard analog pins which may potentially inject negative current.
Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.12 does not
affect the ADC accuracy.
Symbol
Parameter
Test conditions
Typ
Max(3)
3.
Based on characterization, not tested in production.
Unit
ET
Total unadjusted error
fPCLK2 = 28 MHz,
fADC = 14 MHz, RAIN < 10 kΩ,
VDDA = 3 V to 3.6 V
TA = 25 °C
Measurements made after
ADC calibration
±1.3
±2
LSB
EO
Offset error
±1
±1.5
EG
Gain error
±0.5
±1.5
ED
Differential linearity error
±0.7
±1
EL
Integral linearity error
±0.8
±1.5
R
AIN
T
S
f
ADC
C
ADC
2
N2
+
()
ln
×
×
--------------------------------------------------------------
R
ADC
<



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