74LVC08A

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© NXP Semiconductors N.V. 2016. All rights reserved.

Product data sheet

Rev. 7 — 19 April 2016

7 of 15

NXP Semiconductors

74LVC08A

Quad 2-input AND gate

Test data is given in Table 8. Definitions for test circuit:

RL = Load resistance

CL = Load capacitance including jig and probe capacitance

RT = Termination resistance should be equal to output impedance Zo of the pulse generator

Fig 7.

Test circuit for measuring switching times

Table 8.

Test data

Supply voltage

Input

Load

VI

tr, tf

CL

RL

1.2 V

VCC

 2 ns

30 pF

1 k



1.65 V to 1.95 V

VCC

 2 ns

30 pF

1 k



2.3 V to 2.7 V

VCC

 2 ns

30 pF

500



2.7V

2.7V

 2.5 ns

50 pF

500



3.0Vto 3.6V

2.7V

 2.5 ns

50 pF

500

