SPC560B50x datasheet(71/116 Pages) STMICROELECTRONICS

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SPC560B40x/50x, SPC560C40x/50x

Package pinouts and signal descriptions

115

3.20.2

Electromagnetic interference (EMI)

The product is monitored in terms of emission based on a typical application. This emission

test conforms to the IEC 61967-1 standard, which specifies the general conditions for EMI

measurements.

3.20.3

Absolute maximum ratings (electrical sensitivity)

Based on two different tests (ESD and LU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

3.20.3.1

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test

conforms to the AEC-Q100-002/-003/-011 standard. For more details, refer to the

application note Electrostatic Discharge Sensitivity Measurement (AN1181).

Table 34. EMI radiated emission measurement(1)(2)

Symbol

Parameter

Conditions

Value

Unit

Min

Typ

Max

—

— Scan range

—

0.150

—

1000

MHz

fCPU

— Operating frequency

—

MHz

VDD_LV

— LV operating voltages

—

1.28

—

SEMI

T Peak level

VDD = 5 V, TA = 25 °C,

LQFP144 package



Test conforming to IEC

61967-2,



fOSC = 8 MHz/fCPU = 64

MHz

No PLL

frequency

modulation

—

dBµV

±2% PLL

frequency



modulation

—

dBµV

EMI testing and I/O port waveforms per IEC 61967-1, -2, -4

For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your local

marketing representative.

Table 35. ESD absolute maximum ratings(1) (2)

Symbol

Ratings

Conditions

Class

Max value

Unit

VESD(HBM) CC T

Electrostatic discharge voltage



(Human Body Model)

TA = 25 °C

conforming to AEC-Q100-002

H1C

2000

VESD(MM) CC T

Electrostatic discharge voltage



(Machine Model)

TA = 25 °C

conforming to AEC-Q100-003

200

VESD(CDM) CC T

Electrostatic discharge voltage



(Charged Device Model)

TA = 25 °C

conforming to AEC-Q100-011

C3A

500

750 (corners)

All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.

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