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PCF5271CVM100 Datasheet(PDF) 33 Page - Freescale Semiconductor, Inc |
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PCF5271CVM100 Datasheet(HTML) 33 Page - Freescale Semiconductor, Inc |
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33 / 56 page ![]() Preliminary Electrical Characteristics MCF5271 Integrated Microprocessor Hardware Specification, Rev. 1.2 Freescale Semiconductor 33 8.2 Thermal Characteristics Table 27 lists thermal resistance values 2 This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (e.g., either VSS or OVDD). 3 Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate resistance values for positive and negative clamp voltages, then use the larger of the two values. 4 All functional non-supply pins are internally clamped to VSS and OVDD. 5 Power supply must maintain regulation within operating OVDD range during instantaneous and operating maximum current conditions. If positive injection current (Vin > OVDD) is greater than IDD, the injection current may flow out of OVDD and could result in external power supply going out of regulation. Insure external OVDD load will shunt current greater than maximum injection current. This will be the greatest risk when the processor is not consuming power (ex; no clock).Power supply must maintain regulation within operating OVDD range during instantaneous and operating maximum current conditions. Table 27. Thermal Characteristics Characteristic Symbol 196 MAPBGA 160QFP Unit Junction to ambient, natural convection Four layer board (2s2p) θ JMA 321,2 NOTES: 1 θ JMA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Motorola recommends the use of θ JmA and power dissipation specifications in the system design to prevent device junction temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature specification can be verified by physical measurement in the customer’s system using the Ψ jt parameter, the device power dissipation, and the method described in EIA/JESD Standard 51-2. 2 Per JEDEC JESD51-6 with the board horizontal. 403,4 3 θ JMA and Ψjt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Motorola recommends the use of θ JmA and power dissipation specifications in the system design to prevent device junction temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature specification can be verified by physical measurement in the customer’s system using the Ψ jt parameter, the device power dissipation, and the method described in EIA/JESD Standard 51-2. 4 Per JEDEC JESD51-6 with the board horizontal. °C/W Junction to ambient (@200 ft/min) Four layer board (2s2p) θ JMA 295,6 365,6 °C/W Junction to board θ JB 205 5 Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. 256 6 Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. °C/W Junction to case θ JC 107 108 °C/W Junction to top of package Ψ jt 25,9 25,10 °C/W Maximum operating junction temperature Tj 104 105 oC |
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