ADS58C48IPFPR datasheet(5/70 Pages) TI

5 / 70 page

ADS58C48

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SLAS689 – MAY 2010

ELECTRICAL CHARACTERISTICS

Typical values are at 25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sampling frequency = 200 MSPS, 50% clock duty cycle, –1

dBFS differential analog input, LVDS and CMOS interfaces unless otherwise noted.

MIN and MAX values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 1.8 V, DRVDD = 1.8 V

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Resolution

bits

ANALOG INPUTS

Differential input voltage range

Vpp

Differential input resistance (at 200 MHz, see

0.75

Figure 52)

Differential input capacitance (at 200 MHz, see

3.7

Figure 53)

Analog input bandwidth

550

MHz

Analog input common mode current (per input pin

0.8

µA/MSPS

of each channel)

VCM common mode voltage output

0.95

VCM output current capability

POWER SUPPLY

IAVDD

Analog supply current

290

330

IDRVDD

350-mV LVDS swing with 100-

Output buffer supply current LVDS interface

207

230

external termination after reset.

Analog power

522

Digital power LVDS interface

373

Global power down

ELECTRICAL CHARACTERISTICS

Typical values are at 25°C, AVDD = 1.8 V, DRVDD = 1.8 V, sampling frequency = 200 MSPS, 50% clock duty cycle, –1

dBFS differential analog input, LVDS and CMOS interfaces unless otherwise noted.

MIN and MAX values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = 1.8 V, DRVDD = 1.8 V

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

DC ACCURACY

DNL

Differential non-linearity

Fin = 170 MHz

–0.9

1.2

LSB

INL

Integral non-linearity

Fin = 170 MHz

–2.0

±1.0

2.0

LSB

Specified across devices and across channels

Offset error

–25

within a device

There are two sources of gain error – internal reference inaccuracy and channel gain error

Gain error due to internal reference

Specified across devices and across channels

–2.5

2.5

%FS

inaccuracy alone

within a device

Specified across devices and across channels

Gain error of channel alone(1)

–0.1% –1.0%

within a device

Channel gain error temperature

0.001

Δ%/°C

coefficient

(1)

This is specified by design and characterization; it is not tested in production.

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