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KMA310 Datasheet(PDF) 26 Page - NXP Semiconductors |
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KMA310 Datasheet(HTML) 26 Page - NXP Semiconductors |
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26 / 71 page ![]() NXP Semiconductors KMA310 Programmable angle sensor IC KMA310 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2019. All rights reserved. Product data sheet Rev. 3 — 27 February 2019 26 / 71 10.6 Self-diagnostic overview Table 35. Self-diagnostic overview Diagnostic block Mode Monitoring interval Output behavior Supply overvoltage detection (SM-16) always continuously ≤ 4 %VDD Supply undervoltage detection (SM-17) always continuously ≤ 4 %VDD Power-loss detection (SM-18) (broken VDD wire) always continuously ≤ 4 %VDD GND-loss detection (SM-19) (broken GND wire) always continuously ≥ 96 %VDD NVM CRC (SM-20) startup - ≤ 4 %VDD NVM EDC double-bit error check (SM-21) NVM read - ≤ 4 %VDD NVM error correcting code (ECC) single-bit error check (SM-22) NVM read - SENT status nibble pre-warning bit analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 801h Magnetic field conversion check (SM-01) always 1.04 ms ASIL_FLAGS: 0001h analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 802h Inverted angle calculation check (SM-02) always 2.08 ms ASIL_FLAGS: 0002h analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 804h Data division check (SM-03) always 2.08 ms ASIL_FLAGS: 0004h analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 808h Data conversion check (SM-04) always 2.08 ms ASIL_FLAGS: 0008h analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 810h Adjusted angle calculation check (SM-05) always 2.08 ms ASIL_FLAGS: 0010h analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 820h Control signal check (SM-06) always 160 µs ASIL_FLAGS: 0020h analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 820h BIST completion check (SM-07) always 1.25 µs ASIL_FLAGS: 0040h analog: ≤ 4 %VDD or ≥ 96 %VDD[1] SENT ESP: 840h BIST encoding check (SM-08) always 1.25 µs ASIL_FLAGS: 0080h |
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